X-ray method for the structural investigation of thin organic films
نویسندگان
چکیده
2014 The structures of thin lamellar films can be determined through a combination of three X-ray experiments using synchrotron radiation. Diffraction experiments in the transmission geometry give the intralamellar ordering, the diffraction at small glancing angles yields the interlamellar organization, and the critical reflection provides the density measurement which is required to obtain the number of structural units per cell. This method is illustrated here with the study of an organic compound deposited in Langmuir-Blodgett films. J. Physique 47 (1986) 1249-1256 JUILLET 1986, Classification Physics Abstracts 68 . 90 68.55 61.65
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